samsung exynos auto t5123 firmware
productUScpe:2.3:o:samsung:exynos_auto_t5123_firmware:*:*:*:*:*:*:*:*
A product tracked in the threat graph; the vulnerabilities below are known to affect it.
0
KEV-listed
0
public exploit
by severity
9critical11high1medium0low
updated 2026-10-27
01
vulnerabilities (21)
Related CVEs.
| ID | severity | exploitable |
|---|---|---|
| CVE-2023-24033US | critical9.8 | — |
| CVE-2023-26496US | critical9.8 | — |
| CVE-2023-26498US | critical9.8 | — |
| CVE-2023-26497US | critical9.8 | — |
| CVE-2023-26073US | critical9.8 | — |
| CVE-2023-26072US | critical9.8 | — |
| CVE-2023-26074US | critical9.8 | — |
| CVE-2023-26075US | critical9.8 | — |
| CVE-2023-26076US | critical9.8 | — |
| CVE-2023-29091US | high7.5 | — |
| CVE-2023-29087US | high7.5 | — |
| CVE-2023-29086US | high7.5 | — |
| CVE-2023-29085US | high7.5 | — |
| CVE-2023-29090US | high7.5 | — |
| CVE-2023-29089US | high7.5 | — |
| CVE-2023-29088US | high7.5 | — |
| CVE-2023-41112US | high7.5 | — |
| CVE-2023-41111US | high7.5 | — |
| CVE-2023-37368US | high7.5 | — |
| CVE-2023-37367US | medium5.3OT elevated | — |
| CVE-2024-29152US | high7.5 | — |
02
weaknesses (8)
The flaw types (CWEs) most of these CVEs share.
- CWE-787Out-of-bounds Write13 CVEs
- CWE-120Buffer Copy without Checking Size of Input ('Classic Buffer Overflow')3 CVEs
- CWE-1173Improper Use of Validation Framework1 CVEs
- CWE-119Improper Restriction of Operations within the Bounds of a Memory Buffer1 CVEs
- CWE-125Out-of-bounds Read1 CVEs
- CWE-20Improper Input Validation1 CVEs
- CWE-200Exposure of Sensitive Information to an Unauthorized Actor1 CVEs
- CWE-476NULL Pointer Dereference1 CVEs
03
sources (1)
Which sources assert this record, and when.
- USNVD / CVE21 CVEs
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