Qualcomm Technologies Inc. QCA6420

productRU

A product tracked in the threat graph; the vulnerabilities below are known to affect it.

0
EPSS ≥ 10%
by severity
3critical29high6medium0low
updated 2026-10-28
01

vulnerabilities (64)

Related CVEs.

IDseverity exploitable
CVE-2023-33107UShigh7.8OT criticalKEV
CVE-2023-33063UShigh7.8OT criticalKEV
CVE-2021-1931USmedium6.7Exploit
CVE-2022-25670UShigh7.5—
CVE-2022-25669UShigh7.5—
CVE-2022-22091UShigh7.5—
CVE-2022-25706UShigh7.5—
CVE-2022-25690UShigh7.5—
CVE-2023-28540UShigh7.5—
CVE-2022-25686UScritical9.8—
CVE-2025-21483US——
CVE-2022-25688UScritical9.8—
CVE-2022-33284USmedium6.5—
CVE-2025-27066US——
CVE-2024-53026US——
CVE-2022-33252USmedium5.5—
CVE-2025-21427UShigh8.2—
CVE-2024-53021US——
CVE-2023-21665UShigh7.8—
CVE-2024-38408UScritical9.1—
CVE-2022-22074UShigh7.8—
CVE-2022-22066UShigh7.8—
CVE-2023-28578UShigh7.8—
CVE-2022-25653USmedium5.5—
CVE-2021-35090UShigh7.8—
CVE-2022-33267UShigh7.8—
CVE-2022-33227UShigh7.8—
CVE-2022-40523USmedium5.5—
CVE-2026-21374US——
CVE-2024-45551US——
CVE-2024-43046US——
CVE-2022-33243UShigh7.8—
CVE-2025-21441US——
CVE-2025-21440US——
CVE-2024-33044UShigh7.8—
CVE-2024-33056UShigh7.8—
CVE-2023-43554UShigh7.8—
CVE-2024-38420UShigh7.8—
CVE-2024-21469UShigh7.8—
CVE-2024-21465UShigh7.8—
CVE-2024-45561US——
CVE-2024-23368US——
CVE-2025-27055US——
CVE-2025-27050US——
CVE-2025-27046US——
CVE-2024-53009UShigh7.8—
CVE-2025-47387US——
CVE-2026-21376US——
CVE-2026-21371US——
CVE-2025-21466US——
showing 50 of 64
02

weaknesses (8)

The flaw types (CWEs) most of these CVEs share.

  • CWE-126Buffer Over-read19 CVEs
  • CWE-125Out-of-bounds Read13 CVEs
  • CWE-119Improper Restriction of Operations within the Bounds of a Memory Buffer9 CVEs
  • CWE-787Out-of-bounds Write8 CVEs
  • CWE-367Time-of-check Time-of-use (TOCTOU) Race Condition6 CVEs
  • CWE-120Buffer Copy without Checking Size of Input ('Classic Buffer Overflow')4 CVEs
  • CWE-129Improper Validation of Array Index4 CVEs
  • CWE-416Use After Free4 CVEs
03

sources (1)

Which sources assert this record, and when.

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